Multi-run Memory Tests For Pattern Sensitive Faults - Ireneusz Mrozek

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Multi-run Memory Tests For Pattern Sensitive Faults - Ireneusz Mrozek

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Multi-run Memory Tests For Pattern Sensitive Faults - Ireneusz Mrozek

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Multi-run Memory Tests For Pattern Sensitive Faults - Ireneusz Mrozek

This Book Describes Efficient Techniques For Production Testing As Well As For Periodic Maintenance Testing (specifically In Terms Of Multi-cell Faults) In Modern Semiconductor Memory. The Author Discusses Background Selection And Address Reordering Algorithms In Multi-run Transparent March Testing Processes. Formal Methods For Multi-run Test Generation And Many Solutions To Increase Their Efficiency Are Described In Detail.
  • Brand: Unbranded
  • Category: Science, Medicine & Nature
  • Format: Paperback
  • Language: English
  • Publication Date: 2019-02-01
  • Publisher / Label: Springer Nature B.V
  • Author: Ireneusz Mrozek
  • Number of Pages: 148
  • Fruugo ID: 469761503-983716427
  • ISBN: 9783030081980
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